Carl Mayer paper on SPMs
نویسنده
چکیده
Since its invention in 1986 by G. Binnig and C.F. Quate (Binnig), the atomic force microscope (or AFM) has become an essential tool for the characterization of materials, especially in the field of nanotechnology. This is due to the technique's resolution, surface sensitivity, versatility with respect to sample characteristics, its ability to be used in multiple working environments as well as its low cost. With its lateral resolution of 3 nm and its vertical resolution of less than .1 nm (Binnig) the AFM can image nanostructures previously only able to be imaged with Scanning Tunneling Microscopy (STM) and high resolution Transmission Electron Microscopy (TEM). The surface sensitivity of the technique can both help and hurt depending on the application. This is because, as opposed to scanning electron microscopy (SEM) or TEM which have a finite interaction volume, the AFM is a true surface characterization technique. The AFM is also unique in that it does not require a conductive sample or coating. This is especially relevant to the electronics research community because it allows insulating thin films to be imaged accurately without the charging effects seen in SEM. The AFM is also not hindered by the rigid sample preparation requirements needed for TEM which makes it ideal for nondestructive evaluation. But what makes the AFM truly unique compared to these other techniques is its flexible working environments. Being able to make measurements in atmosphere, high vacuum, and even liquid solution opens whole new areas of study in the field of biology and medicine.
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تاریخ انتشار 2011